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Tom Becker
Orcid ID:
0000-0002-2446-0293
List of publications:
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Lehrstuhl für Elektronische Bauelemente
Project Memberships
(1)
Publications
(10)
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Journal article
Journal article
Book chapter / Article in edited volumes
Book chapter / Article in edited volumes
Authored book
Authored book
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Translation
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Thesis
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Edited Volume
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Conference contribution
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Modelling-Augmented Failure Diagnostics in Planar SiC MOS Devices Using TDDB Measurements (2024)
Cornigli D, Schlichting H, Becker T, Larcher L, Erlbacher T, Pešić M
Journal article
Plasma Treatment after NiSi-Based Ohmic Contact Formation on 4H-SiC to Enhance Adhesion of Subsequent Backside Metallization (2024)
Becker T, Hellinger C, Fuchs A, Körfer J, Rusch O
Journal article
SiC engineered substrate: increasing SiC MOSFETs current density from device to module level (2024)
Becker T
Conference contribution, Conference Contribution
The Influence of Extended Defects in 4H-SiC Epitaxial Layers on Gate Oxide Performance and Reliability (2023)
Schlichting H, Lim M, Becker T, Kallinger B, Erlbacher T
Journal article
The Influence of Extended Defects in 4H-SiC Epitaxial Layers on Gate Oxide Performance and Reliability (2023)
Becker T
Authored book, Volume of book series
Proven Power Cycling Reliability of Ohmic Annealing Free SiC Power Device Through the Use of SmartSiC™ Substrate (2023)
Becker T
Authored book, Volume of book series
Improved Power Cycling Reliability through the use of SmartSiC ™ Engineered Substrate for Power Devices (2023)
Becker T
Conference contribution, Conference Contribution
The Influence of Extended Defects in 4H-SiC Epitaxial Layers on Gate Oxide Performance and Reliability (2023)
Schlichting H, Lim M, Becker T, Kallinger B, Erlbacher T
Book chapter / Article in edited volumes
Proven Power Cycling Reliability of SmartSiC™ Substrate for Power Devices (2022)
Becker T
Conference contribution, Conference Contribution
Reliability of Silicon-Nitride based High-Voltage Monolithic Capacitors (2021)
Becker T
Other publication type, Workshop