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Holger Schlichting
List of publications:
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Lehrstuhl für Elektronische Bauelemente
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(1)
Publications
(7)
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Journal article
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Book chapter / Article in edited volumes
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Authored book
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Modelling-Augmented Failure Diagnostics in Planar SiC MOS Devices Using TDDB Measurements (2024)
Cornigli D, Schlichting H, Becker T, Larcher L, Erlbacher T, Pešić M
Journal article
The Influence of Extended Defects in 4H-SiC Epitaxial Layers on Gate Oxide Performance and Reliability (2023)
Schlichting H, Lim M, Becker T, Kallinger B, Erlbacher T
Journal article
The Influence of Extended Defects in 4H-SiC Epitaxial Layers on Gate Oxide Performance and Reliability (2023)
Schlichting H, Lim M, Becker T, Kallinger B, Erlbacher T
Book chapter / Article in edited volumes
Impact of Extended Defects on the Yield and Performance of 4H-SiC Power Devices (2021)
Schlichting H
Conference contribution, Conference Contribution
Influence of shallow pits and device design of 4H-SiC VDMOS transistors on in-line defect analysis by photoluminescence and differential interference contrast mapping (2020)
Kocher M, Schlichting H, Kallinger B, Rommel M, Bauer AJ, Erlbacher T
Conference contribution
Design Considerations for Robust Manufacturing and High Yield of 1.2 kV 4H-SiC VDMOS Transistors (2019)
Schlichting H, Sledziewski T, Bauer A, Erlbacher T
Journal article
Design considerations for robust manufacturing and high yield of 1.2 kv 4H-SIC VDMOS transistors (2019)
Schlichting H, Sledziewski T, Bauer AJ, Erlbacher T
Conference contribution