Zhang H, Fritscher M, Wenger C, Fey D (2026)
Publication Type: Conference contribution
Publication year: 2026
Publisher: Institute of Electrical and Electronics Engineers Inc.
Pages Range: 56-57
Conference Proceedings Title: Proceedings - 2026 IEEE 14th International Workshop on Energy Harvesting and Energy-Neutral Sensing Systems, ENSsys 2026
ISBN: 9798319521330
DOI: 10.1109/ENSsys71150.2026.00017
Intermittent systems rely on checkpointing to survive frequent power failures, yet persistence is often modeled as an atomic event. This abstraction can hide timing-related failures when non-volatile writes require a finite completion window. We present a closed-loop intermittent RISC-V simulation framework in which a storage capacitor, harvested-energy input, power-state controller, and checkpointed architectural state interact cycle by cycle. To capture this behavior, checkpoint writes are modeled as multi-cycle transactions rather than instantaneous commits. Using real harvested-energy traces, we observe two effects. First, atomic persistence can introduce non-physical single-cycle voltage drops that spuriously trigger shutdown. Second, checkpoint feasibility depends not only on remaining energy but also on whether the write can finish before brownout. Overall, the results indicate that time-aware persistence modeling is necessary for realistic intermittent-system evaluation.
APA:
Zhang, H., Fritscher, M., Wenger, C., & Fey, D. (2026). Time-Aware Modeling of RRAM Persistence in Closed-Loop RISC-V Intermittent Systems. In Proceedings - 2026 IEEE 14th International Workshop on Energy Harvesting and Energy-Neutral Sensing Systems, ENSsys 2026 (pp. 56-57). Saint Malo, FR: Institute of Electrical and Electronics Engineers Inc..
MLA:
Zhang, Huiqiao, et al. "Time-Aware Modeling of RRAM Persistence in Closed-Loop RISC-V Intermittent Systems." Proceedings of the 14th IEEE International Workshop on Energy Harvesting and Energy-Neutral Sensing Systems, ENSsys 2026 - held in conjunction with CPS-IoT Week 2026, Saint Malo Institute of Electrical and Electronics Engineers Inc., 2026. 56-57.
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