Reliability of Silicon-Nitride based High-Voltage Monolithic Capacitors

Becker T (2021)

Publication Language: English

Publication Type: Other publication type, Workshop

Publication year: 2021

Event location: Digital Event

DOI: 10.24406/publica-fhg-410867

Authors with CRIS profile

Tom Becker Lehrstuhl für Elektronische Bauelemente

How to cite

APA:

Becker, T. (2021). Reliability of Silicon-Nitride based High-Voltage Monolithic Capacitors.

MLA:

Becker, Tom. Reliability of Silicon-Nitride based High-Voltage Monolithic Capacitors. 2021.

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