Detailed Characterization of Isolated Single and Half-Bridge Gate Drivers from Room Temperature to Cryogenic Temperatures

Büttner S, Freundorfer I, März M (2025)


Publication Type: Journal article

Publication year: 2025

Journal

Book Volume: 14

Pages Range: 1297

Issue: 7

DOI: 10.3390/electronics14071297

Abstract

This study provides a comprehensive characterization of various isolated single and half-bridge gate drivers over the entire temperature range from room temperature down to −194 °C. Unlike previous studies, which primarily focused on electrical output parameters such as rise/fall times and propagation delays, this paper also explores critical functionalities like undervoltage lockout (UVLO) and common-mode transient immunity (CMTI). The first comprehensive characterization of the power-up and power-down behavior of gate drivers identified critical operating states for practical use. In addition, CMTI testing revealed the premature functional failures of some drivers at low temperatures.

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How to cite

APA:

Büttner, S., Freundorfer, I., & März, M. (2025). Detailed Characterization of Isolated Single and Half-Bridge Gate Drivers from Room Temperature to Cryogenic Temperatures. Electronics, 14, 1297. https://doi.org/10.3390/electronics14071297

MLA:

Büttner, Stefanie, Inka Freundorfer, and Martin März. "Detailed Characterization of Isolated Single and Half-Bridge Gate Drivers from Room Temperature to Cryogenic Temperatures." Electronics 14 (2025): 1297.

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