Experimental Investigation of Terahertz Wave Scattering by Statistically Controlled Rough Surfaces
Alissa M, Friederich B, Kolpatzeck K, Czylwik A, Kaiser T (2019)
Publication Type: Conference contribution
Publication year: 2019
Publisher: Institute of Electrical and Electronics Engineers Inc.
Pages Range: 100-102
Conference Proceedings Title: IMWS-AMP 2019 - 2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications
Event location: Bochum
ISBN: 9781728109350
DOI: 10.1109/IMWS-AMP.2019.8880134
Abstract
In this work, the experimental investigation of electromagnetic wave scattering by statistically controlled rough surfaces in the lower THz band is demonstrated. Rough surfaces with height fluctuations following normal statistics are fabricated using two different 3D printing techniques. The results presented here confirm that the surface roughness has a noticeable effect on the level of the diffuse scattering energy. In the future, the applied method can be used to validate analytical models as well as to gain scattering patterns from more complicated rough surface structures which fall outside the limits of most analytical approximations.
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APA:
Alissa, M., Friederich, B., Kolpatzeck, K., Czylwik, A., & Kaiser, T. (2019). Experimental Investigation of Terahertz Wave Scattering by Statistically Controlled Rough Surfaces. In IMWS-AMP 2019 - 2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (pp. 100-102). Bochum, DE: Institute of Electrical and Electronics Engineers Inc..
MLA:
Alissa, Mai, et al. "Experimental Investigation of Terahertz Wave Scattering by Statistically Controlled Rough Surfaces." Proceedings of the 5th IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IMWS-AMP 2019, Bochum Institute of Electrical and Electronics Engineers Inc., 2019. 100-102.
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