Späth A, Vollnhals F, TU F, Prince KC, Richter R, Raabe J, Marbach H, Fink RH (2018)
Publication Type: Journal article, Original article
Publication year: 2018
Book Volume: 24
Pages Range: 116-117
Journal Issue: S2
DOI: 10.1017/S1431927618012965
APA:
Späth, A., Vollnhals, F., TU, F., Prince, K.C., Richter, R., Raabe, J.,... Fink, R.H. (2018). Focused Soft X-Ray Beam Induced Deposition: Recent Advances to a Novel Approach for Fabrication of Metallic Nanostructures. Microscopy and Microanalysis, 24(S2), 116-117. https://doi.org/10.1017/S1431927618012965
MLA:
Späth, Andreas, et al. "Focused Soft X-Ray Beam Induced Deposition: Recent Advances to a Novel Approach for Fabrication of Metallic Nanostructures." Microscopy and Microanalysis 24.S2 (2018): 116-117.
BibTeX: Download