Oil-slick observation using single look complex terraSAR-X dual-polarized data
Velotto D, Migliaccio M, Nunziata F, Lehner S (2010)
Publication Type: Conference contribution
Publication year: 2010
Publisher: Institute of Electrical and Electronics Engineers Inc.
Pages Range: 3684-3687
Conference Proceedings Title: International Geoscience and Remote Sensing Symposium (IGARSS)
Event location: Honolulu, HI, USA
ISBN: 9781424495658
DOI: 10.1109/IGARSS.2010.5648883
Abstract
In this study single look complex (SSC) TerraSAR-X dual-polarized data are firstly exploited for sea oil slick observation purposes. An electromagnetic model which, based on the Co-polarised Phase Difference between the HH and VV channels (CPD), allows describing the X-band sea surface scattering with and without surface slicks is proposed. Following this rationale, the polarimetric approach is firstly developed and applied to X-band Synthetic Aperture Radar (SAR) data in which both certified oil slicks and look-alikes are present. Experimental results demonstrate, for the first time, that X-band dual-polarimetric SAR data are suitable for sea oil slicks observation purposes and witness the paramount importance of the TerraSAR-X dual-polarimetric mode for such application. © 2010 IEEE.
Involved external institutions
Deutsches Zentrum für Luft- und Raumfahrt e.V. (DLR) / German Aerospace Center
Germany (DE)
University of Naples "Parthenope"
Italy (IT)
Germany (DE)
University of Naples "Parthenope"
Italy (IT)
How to cite
APA:
Velotto, D., Migliaccio, M., Nunziata, F., & Lehner, S. (2010). Oil-slick observation using single look complex terraSAR-X dual-polarized data. In International Geoscience and Remote Sensing Symposium (IGARSS) (pp. 3684-3687). Honolulu, HI, USA: Institute of Electrical and Electronics Engineers Inc..
MLA:
Velotto, Domenico, et al. "Oil-slick observation using single look complex terraSAR-X dual-polarized data." Proceedings of the 2010 30th IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2010, Honolulu, HI, USA Institute of Electrical and Electronics Engineers Inc., 2010. 3684-3687.
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