Fine structure of the upper ocean from high-resolution TerraSAR-X imagery and in-situ measurements

Soloviev A, Maingot C, Fujimura A, Fenton J, Gilman M, Matt S, Lehner S, Velotto D, Brusch S (2010)

Publication Type: Conference contribution

Publication year: 2010

Publisher: Institute of Electrical and Electronics Engineers Inc.

Pages Range: 1944-1947

Conference Proceedings Title: International Geoscience and Remote Sensing Symposium (IGARSS)

Event location: Honolulu, HI, USA

ISBN: 9781424495658

DOI: 10.1109/IGARSS.2010.5653574

Abstract

We investigate small-scale features using SAR imagery, including sharp frontal interfaces, slicks of artificial and natural origin, and wakes of surface ships. Collection of the ground truth data helps in the understanding of the physical mechanisms behind the patterns visible in the image. © 2010 IEEE.

Involved external institutions

University of North Florida (UNF) US United States (USA) (US) Deutsches Zentrum für Luft- und Raumfahrt e.V. (DLR) / German Aerospace Center DE Germany (DE)

How to cite

APA:

Soloviev, A., Maingot, C., Fujimura, A., Fenton, J., Gilman, M., Matt, S.,... Brusch, S. (2010). Fine structure of the upper ocean from high-resolution TerraSAR-X imagery and in-situ measurements. In International Geoscience and Remote Sensing Symposium (IGARSS) (pp. 1944-1947). Honolulu, HI, USA: Institute of Electrical and Electronics Engineers Inc..

MLA:

Soloviev, Alexander, et al. "Fine structure of the upper ocean from high-resolution TerraSAR-X imagery and in-situ measurements." Proceedings of the 2010 30th IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2010, Honolulu, HI, USA Institute of Electrical and Electronics Engineers Inc., 2010. 1944-1947.

BibTeX: Download