Measuring Skin Reflectance and Subsurface Scattering

Weyrich T (2005)


Publication Language: English

Publication Type: Other publication type

Publication year: 2005

City/Town: Cambridge, MA, USA

Journal Issue: TR2005-046

URI: https://www.merl.com/publications/TR2005-046

Open Access Link: https://www.merl.com/publications/TR2005-046

Abstract

It is well known that human facial skin has complex reflectance properties that are difficult to model, render, and edit. We built two measurement devices to analyze and reconstruct the reflectance properties of facial skin. One device is a dome-structured face scanning system equipped with 16 cameras and 150 point light sources that is used to acquire BRDF samples of a face. The other device is a touch-based HDR imaging system to measure subsurface scatter- ing properties of the face. In this technical report we describe how these devices are constructed, calibrated, and used to acquire high-quality reflectance data of human faces.

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How to cite

APA:

Weyrich, T. (2005). Measuring Skin Reflectance and Subsurface Scattering. Cambridge, MA, USA.

MLA:

Weyrich, Tim. Measuring Skin Reflectance and Subsurface Scattering. Cambridge, MA, USA, 2005.

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