Impact of Extended Defects on the Yield and Performance of 4H-SiC Power Devices

Schlichting H (2021)

Publication Language: English

Publication Type: Conference contribution, Conference Contribution

Publication year: 2021

Event location: Xi'an CN

DOI: 10.5281/zenodo.5642677

Authors with CRIS profile

Holger Schlichting Lehrstuhl für Elektronische Bauelemente

How to cite

APA:

Schlichting, H. (2021). Impact of Extended Defects on the Yield and Performance of 4H-SiC Power Devices. In Zendo (Eds.), Proceedings of the 5th Sino MOS-AK Workshop. Xi'an, CN.

MLA:

Schlichting, Holger. "Impact of Extended Defects on the Yield and Performance of 4H-SiC Power Devices." Proceedings of the 5th Sino MOS-AK Workshop, Xi'an Ed. Zendo, 2021.

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