Thürauf S, Korner M, Vogt F, Hornung O, Nasseri MA, Knoll A (2017)
Publication Type: Conference contribution
Publication year: 2017
Publisher: Institute of Electrical and Electronics Engineers Inc.
Pages Range: 1836-1839
Conference Proceedings Title: Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS
ISBN: 9781509028092
DOI: 10.1109/EMBC.2017.8037203
Image-based pose measurements relative to phantoms are used for various applications. Some examples are: tracking, registration or calibration. If highly precise measurements are needed, even changes of environment factors influence the measurements.
APA:
Thürauf, S., Korner, M., Vogt, F., Hornung, O., Nasseri, M.A., & Knoll, A. (2017). Environment effects at phantom-based X-ray pose measurements. In Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS (pp. 1836-1839). Jeju Island, KR: Institute of Electrical and Electronics Engineers Inc..
MLA:
Thürauf, Sabine, et al. "Environment effects at phantom-based X-ray pose measurements." Proceedings of the 39th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2017, Jeju Island Institute of Electrical and Electronics Engineers Inc., 2017. 1836-1839.
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