Automated 3D Defect Detection based on Simulated Reference

Sukowski F, Suth D, Waldyra A, Grulich T, Jung A (2023)

Publication Type: Conference contribution

Publication year: 2023

Authors with CRIS profile

Alexander Jung Lehrstuhl für Informatik 5 (Mustererkennung)

Involved external institutions

Fraunhofer-Institut für Integrierte Schaltungen (IIS) DE Germany (DE)

How to cite

APA:

Sukowski, F., Suth, D., Waldyra, A., Grulich, T., & Jung, A. (2023). Automated 3D Defect Detection based on Simulated Reference.

MLA:

Sukowski, Frank, et al. "Automated 3D Defect Detection based on Simulated Reference." 2023.

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