A fully automated dual-probe scanning near-field optical microscopy technique
Abbasirad N, Kollin K, Janunts N, Setzpfandt F, Pertsch T (2017)
Publication Type: Conference contribution
Publication year: 2017
Publisher: OSA - The Optical Society
Book Volume: Part F66-FiO 2017
Conference Proceedings Title: Optics InfoBase Conference Papers
Event location: Washington, DC, USA
ISBN: 9781557528209
DOI: 10.1364/FIO.2017.JW3A.118
Abstract
An automated, robust dual-probe scanning near-field optical microscope is demonstrated by measuring surface plasmon polaritons. To measure the probe-probe crosstalk, the collision prevention implements two probes oscillating at different frequencies.
Involved external institutions
Friedrich-Schiller-Universität Jena
Germany (DE)
RHK Technology
United States (USA) (US)
Leibniz-Institut für Photonische Technologien e.V.
Germany (DE)
Germany (DE)
RHK Technology
United States (USA) (US)
Leibniz-Institut für Photonische Technologien e.V.
Germany (DE)
How to cite
APA:
Abbasirad, N., Kollin, K., Janunts, N., Setzpfandt, F., & Pertsch, T. (2017). A fully automated dual-probe scanning near-field optical microscopy technique. In Optics InfoBase Conference Papers. Washington, DC, USA: OSA - The Optical Society.
MLA:
Abbasirad, Najmeh, et al. "A fully automated dual-probe scanning near-field optical microscopy technique." Proceedings of the Frontiers in Optics, FiO 2017, Washington, DC, USA OSA - The Optical Society, 2017.
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