Single-shot, real-time carrier-envelope phase measurement and tagging based on stereographic above-threshold ionization at short-wave infrared wavelengths
Zhang Y, Kellner P, Adolph D, Zille D, Wustelt P, Wuerzler D, Skruszewicz S, Moeller M, Sayler AM, Paulus GG (2017)
Publication Type: Journal article
Publication year: 2017
Journal
Book Volume: 42
Pages Range: 5150-5153
Journal Issue: 24
DOI: 10.1364/OL.42.005150
Abstract
A high-precision, single-shot, and real-time carrier-envelope phase (CEP) measurement at 1.8 μm laser wavelength based on stereographic photoelectron spectroscopy is presented. A precision of the CEP measurement of 120 mrad for each and every individual laser shot for a 1 kHz pulse train with randomly varying CEP is demonstrated. Simultaneous to the CEP measurement, the pulse lengths are characterized by evaluating the spatial asymmetry of the measured above-threshold ionization (ATI) spectra of xenon and referenced to a standard pulse-duration measurement based on frequency-resolved optical gating. The validity of the CEP measurement is confirmed by implementing phase tagging for a CEP-dependent measurement of ATI in xenon with high energy resolution.
Involved external institutions
Friedrich-Schiller-Universität Jena
Germany (DE)
Helmholtz-Institut Jena (HI-Jena) / Helmholtz Institute Jena
Germany (DE)
Germany (DE)
Helmholtz-Institut Jena (HI-Jena) / Helmholtz Institute Jena
Germany (DE)
How to cite
APA:
Zhang, Y., Kellner, P., Adolph, D., Zille, D., Wustelt, P., Wuerzler, D.,... Paulus, G.G. (2017). Single-shot, real-time carrier-envelope phase measurement and tagging based on stereographic above-threshold ionization at short-wave infrared wavelengths. Optics Letters, 42(24), 5150-5153. https://doi.org/10.1364/OL.42.005150
MLA:
Zhang, Yinyu, et al. "Single-shot, real-time carrier-envelope phase measurement and tagging based on stereographic above-threshold ionization at short-wave infrared wavelengths." Optics Letters 42.24 (2017): 5150-5153.
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