Seiboth F, Schropp A, Scholz M, Wittwer F, Roedel C, Wuensche M, Ullsperger T, Nolte S, Rahomaki J, Parfeniukas K, Giakoumidis S, Vogt U, Wagner U, Rau C, Boesenberg U, Garrevoet J, Falkenberg G, Galtier EC, Lee HJ, Nagler B, Schroer CG (2017)
Publication Type: Journal article
Publication year: 2017
Book Volume: 8
Article Number: 14623
DOI: 10.1038/ncomms14623
Due to their short wavelength, X-rays can in principle be focused down to a few nanometres and below. At the same time, it is this short wavelength that puts stringent requirements on X-ray optics and their metrology. Both are limited by today's technology. In this work, we present accurate at wavelength measurements of residual aberrations of a refractive X-ray lens using ptychography to manufacture a corrective phase plate. Together with the fitted phase plate the optics shows diffraction-limited performance, generating a nearly Gaussian beam profile with a Strehl ratio above 0.8. This scheme can be applied to any other focusing optics, thus solving the X-ray optical problem at synchrotron radiation sources and X-ray free-electron lasers.
APA:
Seiboth, F., Schropp, A., Scholz, M., Wittwer, F., Roedel, C., Wuensche, M.,... Schroer, C.G. (2017). Perfect X-ray focusing via fitting corrective glasses to aberrated optics. Nature Communications, 8. https://doi.org/10.1038/ncomms14623
MLA:
Seiboth, Frank, et al. "Perfect X-ray focusing via fitting corrective glasses to aberrated optics." Nature Communications 8 (2017).
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