Nanoscale imaging with high photon flux table-Top XUV sources
Rothhardt J, Tadesse GK, Hadrich S, Klas R, Demmler S, Limpert J, Tunnermann A (2017)
Publication Type: Conference contribution
Publication year: 2017
Publisher: Institute of Electrical and Electronics Engineers Inc.
Pages Range: 448-449
Conference Proceedings Title: 2016 IEEE Photonics Conference, IPC 2016
Event location: Waikoloa, HI, USA
ISBN: 9781509019069
DOI: 10.1109/IPCon.2016.7831172
Abstract
Recent advances in table-Top high-harmonic sources allowed for coherent diffractive imaging with a record spatial resolution of 13 nm. Additionally, integration times of only a few seconds will enable 3D tomography, imaging of extended objects and element-specific imaging in the near future.
Involved external institutions
Germany (DE)How to cite
APA:
Rothhardt, J., Tadesse, G.K., Hadrich, S., Klas, R., Demmler, S., Limpert, J., & Tunnermann, A. (2017). Nanoscale imaging with high photon flux table-Top XUV sources. In 2016 IEEE Photonics Conference, IPC 2016 (pp. 448-449). Waikoloa, HI, USA: Institute of Electrical and Electronics Engineers Inc..
MLA:
Rothhardt, Jan, et al. "Nanoscale imaging with high photon flux table-Top XUV sources." Proceedings of the 29th IEEE Photonics Conference, IPC 2016, Waikoloa, HI, USA Institute of Electrical and Electronics Engineers Inc., 2017. 448-449.
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