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Dual-Probe SNOM for the Near-Field Study of Nanostructures

Abbasirad N, Arslan D, Fasold S, Staude I, Setzpfandt F, Pertsch T (2018)

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Publication Type: Conference contribution

Publication year: 2018

Publisher: Institute of Electrical and Electronics Engineers Inc.

Conference Proceedings Title: 2018 Photonics North, PN 2018

Event location: Montreal, QC, CAN

ISBN: 9781538675212

DOI: 10.1109/PN.2018.8438829

Abstract

We employed an automated dual-probe scanning near-field optical microscope to study the light propagation and localization in ordered and disordered nanodisc arrays.

Involved external institutions

How to cite

APA:

Abbasirad, N., Arslan, D., Fasold, S., Staude, I., Setzpfandt, F., & Pertsch, T. (2018). Dual-Probe SNOM for the Near-Field Study of Nanostructures. In 2018 Photonics North, PN 2018. Montreal, QC, CAN: Institute of Electrical and Electronics Engineers Inc..

MLA:

Abbasirad, Najmeh, et al. "Dual-Probe SNOM for the Near-Field Study of Nanostructures." Proceedings of the 2018 Photonics North, PN 2018, Montreal, QC, CAN Institute of Electrical and Electronics Engineers Inc., 2018.

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