Continuous every-single-shot carrier-envelope phase measurement and control at 100 kHz

Hoff D, Furch FJ, Witting T, Ruehle K, Adolph D, Sayler AM, Vrakking MJJ, Paulus GG, Schulz CP (2018)


Publication Type: Journal article

Publication year: 2018

Journal

Book Volume: 43

Pages Range: 3850-3853

Journal Issue: 16

DOI: 10.1364/OL.43.003850

Abstract

With the emergence of high-repetition-rate few-cycle laser pulse amplifiers aimed at investigating ultrafast dynamics in atomic, molecular, and solid-state science, the need for ever faster carrier-envelope phase (CEP) detection and control has arisen. Here we demonstrate a high-speed, continuous, every-single-shot measurement and fast feedback scheme based on a stereo above-threshold ionization time-of-flight spectrometer capable of detecting the CEP and pulse duration at a repetition rate of up to 400 kHz. This scheme is applied to a 100 kHz optical parametric chirped pulse amplification few-cycle laser system, demonstrating improved CEP stabilization and allowing for CEP tagging.

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How to cite

APA:

Hoff, D., Furch, F.J., Witting, T., Ruehle, K., Adolph, D., Sayler, A.M.,... Schulz, C.P. (2018). Continuous every-single-shot carrier-envelope phase measurement and control at 100 kHz. Optics Letters, 43(16), 3850-3853. https://doi.org/10.1364/OL.43.003850

MLA:

Hoff, Dominik, et al. "Continuous every-single-shot carrier-envelope phase measurement and control at 100 kHz." Optics Letters 43.16 (2018): 3850-3853.

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