Tadesse GK, Eschen W, Klas R, Hilbert V, Schelle D, Nathanael A, Zilk M, Steinert M, Schrempel F, Pertsch T, Tuennermann A, Limpert J, Rothhardt J (2018)
Publication Type: Journal article
Publication year: 2018
Book Volume: 8
Article Number: 8677
Journal Issue: 1
DOI: 10.1038/s41598-018-27030-y
Today, coherent imaging techniques provide the highest resolution in the extreme ultraviolet (XUV) and X-ray regions. Fourier transform holography (FTH) is particularly unique, providing robust and straightforward image reconstruction at the same time. Here, we combine two important advances: First, our experiment is based on a table-top light source which is compact, scalable and highly accessible. Second, we demonstrate the highest resolution ever achieved with FTH at any light source (34 nm) by utilizing a high photon flux source and cutting-edge nanofabrication technology. The performance, versatility and reliability of our approach allows imaging of complex wavelength-scale structures, including wave guiding effects within these structures, and resolving embedded nanoscale features, which are invisible for electron microscopes. Our work represents an important step towards real-world applications and a broad use of XUV imaging in many areas of science and technology. Even nanoscale studies of ultra-fast dynamics are within reach.
APA:
Tadesse, G.K., Eschen, W., Klas, R., Hilbert, V., Schelle, D., Nathanael, A.,... Rothhardt, J. (2018). High resolution XUV Fourier transform holography on a table top. Scientific Reports, 8(1). https://doi.org/10.1038/s41598-018-27030-y
MLA:
Tadesse, G. K., et al. "High resolution XUV Fourier transform holography on a table top." Scientific Reports 8.1 (2018).
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