Mapping the near-field interaction of silicon nanodisc arrays by automated dual-tip scanning near-field optical microscopy
Abbasirad N, Arslan D, Berzins J, Fasold S, Staude I, Setzpfandt F, Pertsch T (2019)
Publication Type: Conference contribution
Publication year: 2019
Publisher: Institute of Electrical and Electronics Engineers Inc.
Conference Proceedings Title: 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019
Event location: Munich, DEU
ISBN: 9781728104690
DOI: 10.1109/CLEOE-EQEC.2019.8872668
Abstract
Dual-tip scanning near-field optical microscopy (SNOM) facilitates high-precision spatial positioning of a point-like emitter and detector and has the capability of mapping optical near-field information very close to the dipole-like excitation. Hence, it opens new opportunities to characterize the optical near-field response of subwavelength photonic structures. Here we show that by using a fully automated dual-tip SNOM [1] the local field response of a metasurface, consisting of silicon nanodiscs [2] becomes accessible. In our measurements, one tip of the SNOM excited a single resonant nanodisc of sub-wavelength size, whereas the second tip mapped the near-field of the surrounding discs excited via in-plane coupling.
Involved external institutions
Germany (DE)How to cite
APA:
Abbasirad, N., Arslan, D., Berzins, J., Fasold, S., Staude, I., Setzpfandt, F., & Pertsch, T. (2019). Mapping the near-field interaction of silicon nanodisc arrays by automated dual-tip scanning near-field optical microscopy. In 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019. Munich, DEU: Institute of Electrical and Electronics Engineers Inc..
MLA:
Abbasirad, Najmeh, et al. "Mapping the near-field interaction of silicon nanodisc arrays by automated dual-tip scanning near-field optical microscopy." Proceedings of the 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019, Munich, DEU Institute of Electrical and Electronics Engineers Inc., 2019.
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