A high resolution extreme ultraviolet spectrometer system optimized for harmonic spectroscopy and XUV beam analysis

Wuensche M, Fuchs S, Weber T, Nathanael J, Abel JJ, Reinhard J, Wiesner F, Huebner U, Skruszewicz SJ, Paulus GG, Roedel C (2019)

Publication Type: Journal article, Review article

Publication year: 2019

Journal

Review of Scientific Instruments AIP Publishing

Book Volume: 90

Article Number: 023108

Journal Issue: 2

DOI: 10.1063/1.5054116

Abstract

We present a modular extreme ultraviolet (XUV) spectrometer system optimized for a broad spectral range of 12-41 nm (30-99 eV) with a high spectral resolution of λ/Δλ 784 ± 89. The spectrometer system has several operation modes for (1) XUV beam inspection, (2) angular spectral analysis, and (3) imaging spectroscopy. These options allow for a versatile use in high harmonic spectroscopy and XUV beam analysis. The high performance of the spectrometer is demonstrated using a novel cross-sectional imaging method called XUV coherence tomography.

Involved external institutions

Friedrich-Schiller-Universität Jena DE Germany (DE) Leibniz-Institut für Photonische Technologien e.V. DE Germany (DE)

How to cite

APA:

Wuensche, M., Fuchs, S., Weber, T., Nathanael, J., Abel, J.J., Reinhard, J.,... Roedel, C. (2019). A high resolution extreme ultraviolet spectrometer system optimized for harmonic spectroscopy and XUV beam analysis. Review of Scientific Instruments, 90(2). https://doi.org/10.1063/1.5054116

MLA:

Wuensche, Martin, et al. "A high resolution extreme ultraviolet spectrometer system optimized for harmonic spectroscopy and XUV beam analysis." Review of Scientific Instruments 90.2 (2019).

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