XUV coherence tomography with nanoscale resolution driven by high harmonic generation

Fuchs S, Wünsche M, Nathanael J, Abel JJ, Reinhard J, Wiesner F, Skruszewicz S, Rödel C, Paulus GG (2019)

Publication Type: Conference contribution

Publication year: 2019

Publisher: Institute of Electrical and Electronics Engineers Inc.

Conference Proceedings Title: 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019

Event location: Munich, DEU

ISBN: 9781728104690

DOI: 10.1109/CLEOE-EQEC.2019.8872686

Abstract

Optical coherence tomography (OCT) is a well-established method to retrieve three-dimensional, cross-sectional images of biological samples in a non-invasive way using near-infrared radiation. The axial resolution of OCT is on the order of the coherence length lc ∝ λ02/Δλ which depends on the central wavelength λ0 and the spectral width Δλ of the light source. As a consequence, the axial resolution only depends on the spectrum rather than the geometrical properties of the radiation. OCT with broadband visible and near-infrared sources typically reaches axial (depth) resolutions on the order of a few micrometers [1].

Involved external institutions

Friedrich-Schiller-Universität Jena DE Germany (DE)

How to cite

APA:

Fuchs, S., Wünsche, M., Nathanael, J., Abel, J.J., Reinhard, J., Wiesner, F.,... Paulus, G.G. (2019). XUV coherence tomography with nanoscale resolution driven by high harmonic generation. In 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019. Munich, DEU: Institute of Electrical and Electronics Engineers Inc..

MLA:

Fuchs, Silvio, et al. "XUV coherence tomography with nanoscale resolution driven by high harmonic generation." Proceedings of the 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019, Munich, DEU Institute of Electrical and Electronics Engineers Inc., 2019.

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