Single-shot carrier-envelope phase (CEP) measurements and the focal phase effect in strong-field ionization
Zhang Y, Zille D, Hoff D, Wustelt P, Skruszewicz S, Sayler AM, Paulus GG (2019)
Publication Type: Conference contribution
Publication year: 2019
Publisher: Institute of Electrical and Electronics Engineers Inc.
Conference Proceedings Title: 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019
Event location: Munich, DEU
ISBN: 9781728104690
DOI: 10.1109/CLEOE-EQEC.2019.8872222
Abstract
The carrier-envelope phasemeter (CEPM), based on the stereographic detection of above-threshold ionization (ATI) spectra, can measure the carrier-envelope phase (CEP) for each and every single laser shot with high precision [1]. An additional and very valuable feature of the CEPM is that the duration of few-cycle pulses can be characterized simultaneously to the CEP measurements by utilizing the radius of the so-called parametric asymmetry plots (PAPs) that can be derived from the ATI spectra. Recently, this technique has further been developed and now can operate at 1800 nm [2] and at 800 nm with 100 kHz repetition rate [3].
Involved external institutions
Germany (DE)How to cite
APA:
Zhang, Y., Zille, D., Hoff, D., Wustelt, P., Skruszewicz, S., Sayler, A.M., & Paulus, G.G. (2019). Single-shot carrier-envelope phase (CEP) measurements and the focal phase effect in strong-field ionization. In 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019. Munich, DEU: Institute of Electrical and Electronics Engineers Inc..
MLA:
Zhang, Yinyu, et al. "Single-shot carrier-envelope phase (CEP) measurements and the focal phase effect in strong-field ionization." Proceedings of the 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019, Munich, DEU Institute of Electrical and Electronics Engineers Inc., 2019.
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