Sub-cycle metallization of SiO2 nanoparticles probed via carrier-envelope phase dependent electron acceleration

Liu Q, Zherebtsov S, Süßmann F, Passig J, Seiffert L, Mondes V, Kessel A, Trushin S, Graf C, Rühl E, Tiggesbäumker J, Meiwes-Broer KH, Stockman MI, Fennel T, Kling MF (2019)

Publication Type: Conference contribution

Publication year: 2019

Publisher: Institute of Electrical and Electronics Engineers Inc.

Conference Proceedings Title: 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019

Event location: Munich, DEU

ISBN: 9781728104690

DOI: 10.1109/CLEOE-EQEC.2019.8871499

Abstract

We employ few-cycle pulses (4.5 fs duration centered at 720 nm) with controlled carrier-envelope phase (CEP) to probe the metallization of 95 nm diameter SiO2 nanoparticles. The momenta of photoemitted electrons from nanoparticles are recorded via high-energy Stereo Time-Of-Flight (Stereo-TOF) spectroscopy for each laser shot.

Involved external institutions

Max-Planck-Institute of Quantum Optics (MPQ) / Max-Planck-Institut für Quantenoptik

Germany (DE) Universität Rostock

Germany (DE) Freie Universität Berlin

Germany (DE) Georgia State University

United States (USA) (US)

How to cite

APA:

Liu, Q., Zherebtsov, S., Süßmann, F., Passig, J., Seiffert, L., Mondes, V.,... Kling, M.F. (2019). Sub-cycle metallization of SiO2 nanoparticles probed via carrier-envelope phase dependent electron acceleration. In 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019. Munich, DEU: Institute of Electrical and Electronics Engineers Inc..

MLA:

Liu, Q., et al. "Sub-cycle metallization of SiO2 nanoparticles probed via carrier-envelope phase dependent electron acceleration." Proceedings of the 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019, Munich, DEU Institute of Electrical and Electronics Engineers Inc., 2019.

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