Single-shot characterization of strongly focused coherent XUV and soft X-ray beams
Eschen W, Tadesse G, Peng Y, Steinert M, Pertsch T, Limpert J, Rothhardt J (2020)
Publication Type: Journal article
Publication year: 2020
Journal
Book Volume: 45
Pages Range: 4798-4801
Journal Issue: 17
DOI: 10.1364/OL.394445
Abstract
In this Letter, we present a novel, to the best of our knowledge, single-shot method for characterizing focused coherent beams. We utilize a dedicated amplitude-only mask, in combination with an iterative phase retrieval algorithm, to reconstruct the amplitude and phase of a focused beam from a single measured far-field diffraction pattern alone. In a proof-of-principle experiment at a wavelength of 13.5 nm, we demonstrate our new method and obtain an RMS phase error of better than λ/70. This method will find applications in the alignment of complex optical systems, real-time feedback to adaptive optics, and single-shot beam characterization, e.g., at free-electron lasers or high-order harmonic beamlines.
Involved external institutions
Germany (DE)How to cite
APA:
Eschen, W., Tadesse, G., Peng, Y., Steinert, M., Pertsch, T., Limpert, J., & Rothhardt, J. (2020). Single-shot characterization of strongly focused coherent XUV and soft X-ray beams. Optics Letters, 45(17), 4798-4801. https://doi.org/10.1364/OL.394445
MLA:
Eschen, Wilhelm, et al. "Single-shot characterization of strongly focused coherent XUV and soft X-ray beams." Optics Letters 45.17 (2020): 4798-4801.
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