Huygens dipole for nanolocalization

Bag A, Neugebauer M, Wozniak P, Leuchs G, Banzer P (2018)

Publication Type: Conference contribution

Publication year: 2018

Publisher: OSA - The Optical Society

Book Volume: Part F114-FIO 2018

Conference Proceedings Title: Optics InfoBase Conference Papers

Event location: Washington, DC, USA

ISBN: 9781943580460

DOI: 10.1364/FIO.2018.FM3C.6

Abstract

We discuss a nanolocalization technique with sub-nanometer localization resolution based on position dependent transverse Kerker scattering, obtained via interference of tailored electric and magnetic dipole moments.

Authors with CRIS profile

Gerhard Leuchs

Involved external institutions

Max-Planck-Institut für die Physik des Lichts (MPL) / Max Planck Institute for the Science of Light DE Germany (DE)

How to cite

APA:

Bag, A., Neugebauer, M., Wozniak, P., Leuchs, G., & Banzer, P. (2018). Huygens dipole for nanolocalization. In Optics InfoBase Conference Papers. Washington, DC, USA: OSA - The Optical Society.

MLA:

Bag, Ankan, et al. "Huygens dipole for nanolocalization." Proceedings of the Frontiers in Optics, FIO 2018, Washington, DC, USA OSA - The Optical Society, 2018.

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