Transverse Kerker Scattering for Angstrom Localization of Nanoparticles

Bag A, Neugebauer M, Wozniak P, Leuchs G, Banzer P (2018)

Publication Type: Journal article

Publication year: 2018

Journal

Physical Review Letters American Physical Society

Book Volume: 121

Article Number: 193902

Journal Issue: 19

DOI: 10.1103/PhysRevLett.121.193902

Abstract

Angstrom precision localization of a single nanoantenna is a crucial step towards advanced nanometrology, medicine, and biophysics. Here, we show that single nanoantenna displacements down to few angstroms can be resolved with sub-angstrom precision using an all-optical method. We utilize the tranverse Kerker scattering scheme where a carefully structured light beam excites a combination of multipolar modes inside a dielectric nanoantenna, which then, upon interference, scatters directionally into the far field. We spectrally tune our scheme such that it is most sensitive to the change in directional scattering per nanoantenna displacement. Finally, we experimentally show that antenna displacement down to 3 Å is resolvable with a localization precision of 0.6 Å.

Authors with CRIS profile

Gerhard Leuchs

Involved external institutions

Max-Planck-Institut für die Physik des Lichts (MPL) / Max Planck Institute for the Science of Light DE Germany (DE)

How to cite

APA:

Bag, A., Neugebauer, M., Wozniak, P., Leuchs, G., & Banzer, P. (2018). Transverse Kerker Scattering for Angstrom Localization of Nanoparticles. Physical Review Letters, 121(19). https://doi.org/10.1103/PhysRevLett.121.193902

MLA:

Bag, Ankan, et al. "Transverse Kerker Scattering for Angstrom Localization of Nanoparticles." Physical Review Letters 121.19 (2018).

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