Dynamic defects in photonic Floquet topological insulators

Joerg C, Letscher F, Fleischhauer M, Von Freymann G (2017)

Publication Type: Journal article

Publication year: 2017

Journal

New Journal of Physics Institute of Physics: Open Access Journals / Institute of Physics (IoP) and Deutsche Physikalische Gesellschaft

Book Volume: 19

Article Number: 083003

Journal Issue: 8

DOI: 10.1088/1367-2630/aa7c82

Abstract

Edge modes in topological insulators are known to be robust against defects. We investigate if this also holds true when the defect is not static, but varies in time. We study the influence of defects with time-dependent coupling on the robustness of the transport along the edge in a Floquet system of helically curved waveguides. Waveguide arrays are fabricated via direct laser writing in a negative tone photoresist. We find that single dynamic defects do not destroy the chiral edge current, even when the temporal modulation is strong. Quantitative numerical simulation of the intensity in the bulk and edge waveguides confirms our observation.

Involved external institutions

Technische Universität Kaiserslautern DE Germany (DE)

How to cite

APA:

Joerg, C., Letscher, F., Fleischhauer, M., & Von Freymann, G. (2017). Dynamic defects in photonic Floquet topological insulators. New Journal of Physics, 19(8). https://dx.doi.org/10.1088/1367-2630/aa7c82

MLA:

Joerg, Christina, et al. "Dynamic defects in photonic Floquet topological insulators." New Journal of Physics 19.8 (2017).

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