Temporal defects in photonic topological insulators
Jörg C, Letscher F, Fleischhauer M, Von Freymann G (2017)
Publication Type: Conference contribution
Publication year: 2017
Publisher: Institute of Electrical and Electronics Engineers Inc.
Book Volume: 2017-January
Pages Range: 1-2
Conference Proceedings Title: 2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings
Event location: San Jose, CA, USA
ISBN: 9781943580279
DOI: 10.1364/CLEO_QELS.2017.FM2G.4
Abstract
We experimentally study time-dependent defects in a waveguide model of a topological insulator. Backscattering is not observed, but in contrast to static defects, edge modes propagate through the defects.
Involved external institutions
Germany (DE)How to cite
APA:
Jörg, C., Letscher, F., Fleischhauer, M., & Von Freymann, G. (2017). Temporal defects in photonic topological insulators. In 2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings (pp. 1-2). San Jose, CA, USA: Institute of Electrical and Electronics Engineers Inc..
MLA:
Jörg, Christina, et al. "Temporal defects in photonic topological insulators." Proceedings of the 2017 Conference on Lasers and Electro-Optics, CLEO 2017, San Jose, CA, USA Institute of Electrical and Electronics Engineers Inc., 2017. 1-2.
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