Signature of a highly spin polarized resonance state at Co2MnSi(0 0 1)/Ag(0 0 1) interfaces

Lidig C, Minar J, Braun J, Ebert H, Gloskovskii A, Kronenberg A, Klaeui M, Jourdan M (2018)


Publication Type: Journal article

Publication year: 2018

Journal

Book Volume: 51

Article Number: 135307

Journal Issue: 13

DOI: 10.1088/1361-6463/aab1cf

Abstract

We investigated interfaces of halfmetallic Co2MnSi(1 0 0) Heusler thin films with Ag(1 0 0), Cr(1 0 0), Cu and Al layers relevant for spin valves by high energy x-ray photoemission spectroscopy (HAXPES). Experiments on Co2MnSi samples with an Ag(1 0 0) interface showed a characteristic spectral shoulder feature close to the Fermi edge, which is strongly diminished or suppressed at Co2MnSi (1 0 0) interfaces with the other metallic layers. This feature is found to be directly related to the Co2MnSi(1 0 0) layer, as reflected by control experiments with reference non-magnetic films, i.e. without the Heusler layer. By comparison with HAXPES calculations, the shoulder feature is identified as originating from an interface state related to a highly spin polarized surface resonance of Co2MnSi (1 0 0).

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How to cite

APA:

Lidig, C., Minar, J., Braun, J., Ebert, H., Gloskovskii, A., Kronenberg, A.,... Jourdan, M. (2018). Signature of a highly spin polarized resonance state at Co2MnSi(0 0 1)/Ag(0 0 1) interfaces. Journal of Physics D: Applied Physics, 51(13). https://doi.org/10.1088/1361-6463/aab1cf

MLA:

Lidig, Christian, et al. "Signature of a highly spin polarized resonance state at Co2MnSi(0 0 1)/Ag(0 0 1) interfaces." Journal of Physics D: Applied Physics 51.13 (2018).

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