Hysteresis in graphene nanoribbon field-effect devices

Tries A, Richter N, Chen Z, Narita A, Muellen K, Wang H, Bonn M, Klaeui M (2020)


Publication Type: Journal article

Publication year: 2020

Journal

Book Volume: 22

Pages Range: 5667-5672

Journal Issue: 10

DOI: 10.1039/d0cp00298d

Abstract

Hysteresis in the current response to a varying gate voltage is a common spurious effect in carbon-based field effect transistors. Here, we use electric transport measurements to probe the charge transport in networks of armchair graphene nanoribbons with a width of either 5 or 9 carbon atoms, synthesized in a bottom-up approach using chemical vapor deposition. Our systematic study on the hysteresis of such graphene nanoribbon transistors, in conjunction with temperature-dependent transport measurements shows that the hysteresis can be fully accounted for by trapping/detrapping carriers in the SiO2 layer. We extract the trap densities and depth, allowing us to identify shallow traps as the main origin of the hysteresis effect.

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How to cite

APA:

Tries, A., Richter, N., Chen, Z., Narita, A., Muellen, K., Wang, H.,... Klaeui, M. (2020). Hysteresis in graphene nanoribbon field-effect devices. Physical Chemistry Chemical Physics, 22(10), 5667-5672. https://doi.org/10.1039/d0cp00298d

MLA:

Tries, Alexander, et al. "Hysteresis in graphene nanoribbon field-effect devices." Physical Chemistry Chemical Physics 22.10 (2020): 5667-5672.

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