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Investigation on the homogeneity of pulsed electrochemically deposited thermoelectric films with synchrotron μ-XRF, μ-XRD and μ-XANES

Reinsberg KG, Schumacher C, Zastrow S, Nielsch K, Broekaert JAC, Fittschen UEA (2013)

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Publication Type: Journal article

Publication year: 2013

Journal

Book Volume: 1

Pages Range: 4215-4220

Journal Issue: 13

DOI: 10.1039/c3ta01480k

Abstract

Thermoelectric materials are able to generate a voltage and current, when subjected to a gradient of temperature. A cost and time efficient production of thermoelectric units is the goal for future miniaturized thermoelectric generators based on thin films up to 200 μm. A comprehensive analysis of chemical and physical properties is a crucial part of the developments. One of the key parameters for the materials' physical properties is the Seebeck coefficient (S = ΔU/ΔT), which is the generated voltage for a given temperature difference. To determine the origin of a variation of S, which is found for thermoelectric materials, such as Bi2Te3 and Sb2Te3 an investigation on their stoichiometric and structural homogeneity is presented. Nondestructiveness and a mesoscopic spatial resolution are the key parameters which allow for repetitive analyses. The samples are electrochemical deposits of 10 μm thickness on Si wafers. Micro-X-ray fluorescence (μ-XRF) and micro-X-ray diffraction analysis (μ-XRD) with 15 μm spot size are performed simultaneously with focused synchrotron X-ray radiation at 30 keV. Additionally micro-X-ray absorption near edge structure (μ-XANES) measurements are performed. No inhomogeneity is detectable for samples prepared under optimized, pulsed potential conditions. Instead an indication of a correlation between the thermopower (S) variations and sample thickness variations is found. © The Royal Society of Chemistry 2013.

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How to cite

APA:

Reinsberg, K.-G., Schumacher, C., Zastrow, S., Nielsch, K., Broekaert, J.A.C., & Fittschen, U.E.A. (2013). Investigation on the homogeneity of pulsed electrochemically deposited thermoelectric films with synchrotron μ-XRF, μ-XRD and μ-XANES. Journal of Materials Chemistry A, 1(13), 4215-4220. https://dx.doi.org/10.1039/c3ta01480k

MLA:

Reinsberg, Klaus-Georg, et al. "Investigation on the homogeneity of pulsed electrochemically deposited thermoelectric films with synchrotron μ-XRF, μ-XRD and μ-XANES." Journal of Materials Chemistry A 1.13 (2013): 4215-4220.

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