Space-resolved in-plane moduli of graphene oxide and chemically derived graphene applying a simple wrinkling procedure
Kunz DA, Feicht P, Goedrich S, Thurn H, Papastavrou G, Fery A, Breu J (2013)
Publication Type: Journal article
Publication year: 2013
Journal
Book Volume: 25
Pages Range: 1337-1341
Journal Issue: 9
Abstract
Mapping the in-plane moduli: A simple wrinkling process on a deformable substrate requiring only readily available topographical atomic force microscopy (AFM) imaging allows space-resolved determination of the mechanical properties of single graphene oxide and chemically derived graphene sheets. The lateral resolution in the sub-micrometer range delivers unique insights into the defect distribution within the nanoplatelets. Copyright © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Involved external institutions
Germany (DE)How to cite
APA:
Kunz, D.A., Feicht, P., Goedrich, S., Thurn, H., Papastavrou, G., Fery, A., & Breu, J. (2013). Space-resolved in-plane moduli of graphene oxide and chemically derived graphene applying a simple wrinkling procedure. Advanced Materials, 25(9), 1337-1341. https://doi.org/10.1002/adma.201204049
MLA:
Kunz, Daniel A., et al. "Space-resolved in-plane moduli of graphene oxide and chemically derived graphene applying a simple wrinkling procedure." Advanced Materials 25.9 (2013): 1337-1341.
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