Violbarbosa CE, Ouardi S, Kubota T, Mizukami S, Fecher GH, Miyazaki T, Ikenaga E, Felser C (2015)
Publication Type: Journal article
Publication year: 2015
Book Volume: 106
Article Number: 052402
Journal Issue: 5
DOI: 10.1063/1.4907537
X-ray photoelectron diffraction (XPD) in combination with hard X-ray photoelectron spectroscopy (HAXPES) has been used to study the structure of buried layers in thin multilayer films. A detailed layer-by-layer investigation was performed using the element-specific, local-probe character of XPD. In the present work, angular-resolved HAXPES at a photon energy of 7.94 keV photon energy was used to investigate a Cr/Mn
APA:
Violbarbosa, C.E., Ouardi, S., Kubota, T., Mizukami, S., Fecher, G.H., Miyazaki, T.,... Felser, C. (2015). Forward scattering in hard X-ray photoelectron spectroscopy: Structural investigation of buried Mn-Ga films. Applied Physics Letters, 106(5). https://doi.org/10.1063/1.4907537
MLA:
Violbarbosa, Carlos E., et al. "Forward scattering in hard X-ray photoelectron spectroscopy: Structural investigation of buried Mn-Ga films." Applied Physics Letters 106.5 (2015).
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