Claus M, Fediai A, Mothes S, Pacheco A, Ryndyk D, Blawid S, Cuniberti G, Schroter M (2015)
Publication Type: Conference contribution
Publication year: 2015
Publisher: Institute of Electrical and Electronics Engineers Inc.
Conference Proceedings Title: 18th International Workshop on Computational Electronics, IWCE 2015
Event location: West Lafayette, IN, USA
ISBN: 9780692515235
DOI: 10.1109/IWCE.2015.7301946
It is well known that the metal-CNT interfaces in CNTFETs have been a key factor limiting the device performance. Efforts have been made to improve the understanding of physics at these interfaces and the contact length scaling behavior seen in experiments [1]. However, the related interface phenomena are not fully understood [1], which makes it difficult to improve the device performance. Typically, the impact of the metal- CNT interfaces on the device characteristics is lumped into a resistance which is commonly labeled as the contact resistance R
APA:
Claus, M., Fediai, A., Mothes, S., Pacheco, A., Ryndyk, D., Blawid, S.,... Schroter, M. (2015). Multi-scale modeling of metal-CNT interfaces. In 18th International Workshop on Computational Electronics, IWCE 2015. West Lafayette, IN, USA: Institute of Electrical and Electronics Engineers Inc..
MLA:
Claus, M., et al. "Multi-scale modeling of metal-CNT interfaces." Proceedings of the 18th International Workshop on Computational Electronics, IWCE 2015, West Lafayette, IN, USA Institute of Electrical and Electronics Engineers Inc., 2015.
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