Evidence for in-plane tetragonal c-axis in MnxGa1-xthin films using transmission electron microscopy

Karel J, Casoli F, Lupo P, Nasi L, Fabbrici S, Righi L, Albertini F, Felser C (2016)

Publication Type: Journal article

Publication year: 2016

Journal

Scripta Materialia Elsevier

Book Volume: 114

Pages Range: 165-169

DOI: 10.1016/j.scriptamat.2015.11.019

Abstract

Tetragonal Mn x Ga 1-x (x = 0.70, 0.75) thin films grown on SrTiO 3 substrates exhibit perpendicular magnetic anisotropy with coercive fields between 1 and 2 T. Transmission electron microscopy (TEM) and X-ray diffraction (XRD) reveal that 40 nm samples grown at 300-350 °C lead to films with the tetragonal c-axis oriented primarily perpendicular to the film plane but with some fraction of the sample exhibiting the c-axis in the film plane. This structure results in an undesirable secondary magnetic component in the out of plane magnetization. Growth at 300 °C with a reduced thickness or Mn concentration significantly decreases the tetragonal c-axis in the film plane.

Involved external institutions

Max-Planck-Institut für Chemische Physik fester Stoffe (MPI CPfS) / Max Planck Institute for Chemical Physics of Solids

Germany (DE) Istituto dei Materiali per l'Elettronica ed il Magnetismo IMEM

Italy (IT)

How to cite

APA:

Karel, J., Casoli, F., Lupo, P., Nasi, L., Fabbrici, S., Righi, L.,... Felser, C. (2016). Evidence for in-plane tetragonal c-axis in MnxGa1-xthin films using transmission electron microscopy. Scripta Materialia, 114, 165-169. https://doi.org/10.1016/j.scriptamat.2015.11.019

MLA:

Karel, Julie, et al. "Evidence for in-plane tetragonal c-axis in MnxGa1-xthin films using transmission electron microscopy." Scripta Materialia 114 (2016): 165-169.

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