Erratum: Evidence for in-plane tetragonal c-axis in MnxGa1-x thin films using transmission electron microscopy (Scripta Materialia (2016) 114 (165-169) DOI: 10.1016/j.scriptamat.2015.11.019)
Karel J, Casoli F, Lupo P, Nasi L, Fabbrici S, Righi L, Albertini F, Felser C (2016)
Publication Type: Journal article, Erratum
Publication year: 2016
Journal
Book Volume: 120
Pages Range: 112-
DOI: 10.1016/j.scriptamat.2016.03.025
Involved external institutions
Istituto dei Materiali per l'Elettronica ed il Magnetismo IMEM
Italy (IT)
Max-Planck-Institut für Chemische Physik fester Stoffe (MPI CPfS) / Max Planck Institute for Chemical Physics of Solids
Germany (DE)
Italy (IT)
Max-Planck-Institut für Chemische Physik fester Stoffe (MPI CPfS) / Max Planck Institute for Chemical Physics of Solids
Germany (DE)
How to cite
APA:
Karel, J., Casoli, F., Lupo, P., Nasi, L., Fabbrici, S., Righi, L.,... Felser, C. (2016). Erratum: Evidence for in-plane tetragonal c-axis in MnxGa1-x thin films using transmission electron microscopy (Scripta Materialia (2016) 114 (165-169) DOI: 10.1016/j.scriptamat.2015.11.019). Scripta Materialia, 120, 112-. https://doi.org/10.1016/j.scriptamat.2016.03.025
MLA:
Karel, Julie, et al. "Erratum: Evidence for in-plane tetragonal c-axis in MnxGa1-x thin films using transmission electron microscopy (Scripta Materialia (2016) 114 (165-169) DOI: 10.1016/j.scriptamat.2015.11.019)." Scripta Materialia 120 (2016): 112-.
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