Speckle-based x-ray phase-contrast and dark-field imaging with a laboratory source

Zanette I, Zhou T, Burvall A, Lundstrom U, Larsson DH, Zdora MC, Thibault P, Pfeiffer F, Hertz HM (2014)

Publication Type: Journal article

Publication year: 2014

Journal

Physical Review Letters American Physical Society

Book Volume: 112

Article Number: 253903

Journal Issue: 25

DOI: 10.1103/PhysRevLett.112.253903

Abstract

We report on the observation and application of near-field speckles with a laboratory x-ray source. The detection of speckles is possible thanks to the enhanced brilliance properties of the used liquid-metal-jet source, and opens the way to a range of new applications in laboratory-based coherent x-ray imaging. Here, we use the speckle pattern for multimodal imaging of demonstrator objects. Moreover, we introduce algorithms for phase and dark-field imaging using speckle tracking, and we show that they yield superior results with respect to existing methods. © 2014 American Physical Society.

Involved external institutions

Technische Universität München (TUM) DE Germany (DE) Royal Institute of Technology / Kungliga Tekniska Högskolan (KTH) SE Sweden (SE) University College London (UCL) GB United Kingdom (GB)

How to cite

APA:

Zanette, I., Zhou, T., Burvall, A., Lundstrom, U., Larsson, D.H., Zdora, M.-C.,... Hertz, H.M. (2014). Speckle-based x-ray phase-contrast and dark-field imaging with a laboratory source. Physical Review Letters, 112(25). https://doi.org/10.1103/PhysRevLett.112.253903

MLA:

Zanette, I., et al. "Speckle-based x-ray phase-contrast and dark-field imaging with a laboratory source." Physical Review Letters 112.25 (2014).

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