Stockmar M, Zanette I, Dierolf M, Enders B, Clare R, Pfeiffer F, Cloetens P, Bonnin A, Thibault P (2015)
Publication Type: Journal article
Publication year: 2015
Book Volume: 3
Article Number: 014005
Journal Issue: 1
DOI: 10.1103/PhysRevApplied.3.014005
Inline holography, like other lensless imaging methods, circumvents limitations of x-ray optics through an a posteriori phase-retrieval step. However, phase retrieval for optically thick, i.e., strongly absorbing and phase shifting, specimens remains challenging. In this paper, we demonstrate that near-field ptychography can be used to efficiently perform phase retrieval on a uranium sphere with a diameter of about 46 μm, which acts as an optically thick sample. This particular sample was not accessible by inline holography previously. The reconstruction is based on a statistical model and incorporates partial coherence by decomposing the illumination into coherent modes. Furthermore, we observe that phase vortices, which can occur as artifacts during the reconstruction, pose a greater challenge than in far-field methods. We expect that the methods described in this paper will allow production of reliable phase maps of samples which cannot be accessed by inline holography.
APA:
Stockmar, M., Zanette, I., Dierolf, M., Enders, B., Clare, R., Pfeiffer, F.,... Thibault, P. (2015). X-ray near-field ptychography for optically thick specimens. Physical Review Applied, 3(1). https://doi.org/10.1103/PhysRevApplied.3.014005
MLA:
Stockmar, Marco, et al. "X-ray near-field ptychography for optically thick specimens." Physical Review Applied 3.1 (2015).
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