Ruiz-Yaniz M, Zanette I, Rack A, Weitkamp T, Meyer PE, Mohr J, Pfeiffer F (2015)
Publication Type: Journal article
Publication year: 2015
Book Volume: 91
Article Number: 033803
Journal Issue: 3
DOI: 10.1103/PhysRevA.91.033803
The knowledge of the x-ray index of refraction of materials is important for the interpretation or simulation of many x-ray physics phenomena. But its precise and accurate experimental determination is challenging, particularly in the hard x-ray energy range above 100 keV. In this article we present and discuss experimental measurements of the real and imaginary part of the index of refraction for different materials based on x-ray grating interferometry at energies above 130 keV.
APA:
Ruiz-Yaniz, M., Zanette, I., Rack, A., Weitkamp, T., Meyer, P.E., Mohr, J., & Pfeiffer, F. (2015). X-ray-refractive-index measurements at photon energies above 100 keV with a grating interferometer. Physical Review A - Atomic, Molecular, and Optical Physics, 91(3). https://doi.org/10.1103/PhysRevA.91.033803
MLA:
Ruiz-Yaniz, M., et al. "X-ray-refractive-index measurements at photon energies above 100 keV with a grating interferometer." Physical Review A - Atomic, Molecular, and Optical Physics 91.3 (2015).
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