Characterization of near-field ptychography
Clare RM, Stockmar M, Dierolf M, Zanette I, Pfeiffer F (2015)
Publication Type: Journal article
Publication year: 2015
Journal
Book Volume: 23
Pages Range: 19728-19742
Journal Issue: 15
DOI: 10.1364/OE.23.019728
Abstract
Near-field X-ray ptychography has recently been proposed and shown to be able to retrieve a sample's complex-valued transmission function from multiple near-field diffraction images each with a lateral shift of the sample and with a structured (by a diffuser) illumination [Stockmar et al. Sci Rep. 3 (2013)]. In this paper, we undertake the first investigation - via numerical simulation - of the influence of the sampling and step size of the lateral shifts, the diffuser structure size, and the propagation distance on the reconstruction of the sample's transmission function.We find that for a gold Siemens star of thickness 750 nm with typical experimental parameters, for a successful reconstruction - given a theoretical minimum of four required measurements per imaged pixel - at least six diffraction images are required.
Involved external institutions
Germany (DE)How to cite
APA:
Clare, R.M., Stockmar, M., Dierolf, M., Zanette, I., & Pfeiffer, F. (2015). Characterization of near-field ptychography. Optics Express, 23(15), 19728-19742. https://doi.org/10.1364/OE.23.019728
MLA:
Clare, Richard M., et al. "Characterization of near-field ptychography." Optics Express 23.15 (2015): 19728-19742.
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