X-ray microtomography using correlation of near-field speckles for material characterization

Zanette I, Zdora MC, Zhou T, Burvall A, Larsson DH, Thibault P, Hertz HM, Pfeiffer F (2015)

Publication Type: Journal article

Publication year: 2015

Journal

Proceedings of the National Academy of Sciences of the United States of America National Academy of Sciences

Book Volume: 112

Pages Range: 12569-12573

Journal Issue: 41

DOI: 10.1073/pnas.1502828112

Abstract

Nondestructive microscale investigation of objects is an invaluable tool in life and materials sciences. Currently, such investigation is mainly performed with X-ray laboratory systems, which are based on absorption-contrast imaging and cannot access the information carried by the phase of the X-ray waves. The phase signal is, nevertheless, of great value in X-ray imaging as it is complementary to the absorption information and in general more sensitive to visualize features with small density differences. Synchrotron facilities, which deliver a beam of high brilliance and high coherence, provide the ideal condition to develop such advanced phase-sensitive methods, but their access is limited. Here we show how a small modification of a laboratory setup yields simultaneously quantitative and 3D absorption and phase images of the object. This single-shot method is based on correlation of X-ray near-field speckles and represents a significant broadening of the capabilities of laboratory- based X-ray tomography.

Involved external institutions

Technische Universität München (TUM) DE Germany (DE) Diamond Light Source GB United Kingdom (GB) Royal Institute of Technology / Kungliga Tekniska Högskolan (KTH) SE Sweden (SE) University College London (UCL) GB United Kingdom (GB)

How to cite

APA:

Zanette, I., Zdora, M.-C., Zhou, T., Burvall, A., Larsson, D.H., Thibault, P.,... Pfeiffer, F. (2015). X-ray microtomography using correlation of near-field speckles for material characterization. Proceedings of the National Academy of Sciences of the United States of America, 112(41), 12569-12573. https://doi.org/10.1073/pnas.1502828112

MLA:

Zanette, Irene, et al. "X-ray microtomography using correlation of near-field speckles for material characterization." Proceedings of the National Academy of Sciences of the United States of America 112.41 (2015): 12569-12573.

BibTeX: Download