Zdora MC, Thibault P, Herzen J, Pfeiffer F, Zanette I (2016)
Publication Type: Conference contribution
Publication year: 2016
Publisher: American Institute of Physics Inc.
Book Volume: 1696
Conference Proceedings Title: AIP Conference Proceedings
Event location: Melbourne, VIC, AUS
ISBN: 9780735413436
DOI: 10.1063/1.4937510
X-ray dark-field and phase-contrast imaging using near-field speckles is a novel technique that overcomes limitations inherent in conventional absorption X-ray imaging, i.e. poor contrast for features with similar density. Speckle-based imaging yields a wealth of information with a simple setup tolerant to polychromatic and divergent beams, and simple data acquisition and analysis procedures. Here, we present a simulation software used to model the image formation with the speckle-based technique, and we compare simulated results on a phantom sample with experimental synchrotron data. Thorough simulation of a speckle-based imaging experiment will help for better understanding and optimising the technique itself.
APA:
Zdora, M.-C., Thibault, P., Herzen, J., Pfeiffer, F., & Zanette, I. (2016). Simulations of multi-contrast X-ray imaging using near-field speckles. In Martin D. de Jonge, David J. Paterson, Christopher G. Ryan (Eds.), AIP Conference Proceedings. Melbourne, VIC, AUS: American Institute of Physics Inc..
MLA:
Zdora, Marie-Christine, et al. "Simulations of multi-contrast X-ray imaging using near-field speckles." Proceedings of the 12th International Conference on X-Ray Microscopy, XRM 2014, Melbourne, VIC, AUS Ed. Martin D. de Jonge, David J. Paterson, Christopher G. Ryan, American Institute of Physics Inc., 2016.
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