Zanette I, Clare R, Eastwood D, Venkata C, Pfeiffer F, Cloetens P, Thibault P (2020)
Publication Type: Journal article
Publication year: 2020
Book Volume: 14
Article Number: 064078
Journal Issue: 6
DOI: 10.1103/PhysRevApplied.14.064078
X-ray ptychotomography in the near-field regime is a promising technique for high-resolution, quantitative, and nondestructive investigations in materials science, paleontology, and biomedicine. X-ray near-field ptychography has been previously demonstrated in projection and tomography mode, but the quantitativeness of the reconstructed data has never been discussed in detail. Here, we use measurements of a sample made of aluminum and nickel microparticles to evaluate the quantitativeness of the volumetric mass-density data. Moreover, we propose an algorithm (VortRem) for the removal of phase vortexes, a type of artifact that frequently occurs in holographic methods. VortRem and the results presented here may be fundamental for extending the applicability of this emerging technique to quantitative three-dimensional characterization studies of light as well as dense samples down to the nanoscale.
APA:
Zanette, I., Clare, R., Eastwood, D., Venkata, C., Pfeiffer, F., Cloetens, P., & Thibault, P. (2020). Phase-Vortex Removal for Quantitative X-Ray Nanotomography with Near-Field Ptychography. Physical Review Applied, 14(6). https://doi.org/10.1103/PhysRevApplied.14.064078
MLA:
Zanette, Irene, et al. "Phase-Vortex Removal for Quantitative X-Ray Nanotomography with Near-Field Ptychography." Physical Review Applied 14.6 (2020).
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