Forster T, Mayer M, Chauhan V, Ebner T, Wagnery KC, Hagelauer A (2020)
Publication Type: Conference contribution
Publication year: 2020
Publisher: IEEE Computer Society
Book Volume: 2020-September
Conference Proceedings Title: IEEE International Ultrasonics Symposium, IUS
Event location: Las Vegas, NV, USA
ISBN: 9781728154480
DOI: 10.1109/IUS46767.2020.9251782
With increasing number of simultaneously active frequency bands in RF front ends due to carrier aggregation and continuing device miniaturization, nonlinear effects may lead to spurious signals at receiving ports or unwanted interaction of bands. It is crucial to model nonlinear effects in order to identify critical devices and take countermeasures. Effects of third and second order dominate here. Within this work we developed a P-matrix based model, computing nonlinearities of second order in TC-SAW devices. This includes the generation of signals at twice the input frequency, as well as intermodulation of two input tones, namely the second harmonic H2 and the intermodulation product IMD2, respectively. The model includes effects of nonlinear dielectricity, stiffness, piezoelectricity as well as electrostriction. Both electric and acoustic nonlinear sources are considered. Model parameters were determined by fit of the model to second harmonic measurements of resonators. Electric and acoustic nonlinear sources are distinguished by considering two cases: Excitation frequencies around and at half of the resonance frequency, i.e. self generated harmonics and subharmonics, respectively, are measured. The resulting nonlinear dataset allows for a good prediction of H2 and IMD2 in complete TC-SAW filters.
APA:
Forster, T., Mayer, M., Chauhan, V., Ebner, T., Wagnery, K.C., & Hagelauer, A. (2020). A general P-matrix model to calculate second-order nonlinearity in TC-SAW devices. In IEEE International Ultrasonics Symposium, IUS. Las Vegas, NV, USA: IEEE Computer Society.
MLA:
Forster, Thomas, et al. "A general P-matrix model to calculate second-order nonlinearity in TC-SAW devices." Proceedings of the 2020 IEEE International Ultrasonics Symposium, IUS 2020, Las Vegas, NV, USA IEEE Computer Society, 2020.
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