Layer Stack Dependencies of Self-Generated Nonlinear Signals in Layered SAW Resonators

Forster T, Mayer M, Chauhan V, Schmidt P, Ebner T, Wagner K, Hagelauer A (2022)

Publication Type: Conference contribution

Publication year: 2022

Journal

IEEE International Ultrasonics Symposium Institute of Electrical and Electronics Engineers (IEEE)

Publisher: IEEE Computer Society

Book Volume: 2022-October

Conference Proceedings Title: IEEE International Ultrasonics Symposium, IUS

Event location: Venice, ITA

ISBN: 9781665466578

DOI: 10.1109/IUS54386.2022.9957339

Abstract

In this work a systematic investigation was carried out, which targeted the dependencies of nonlinear generated signals on the layer stack of a device. Previous work on material contributions to nonlinearity focused almost exclusively on TC-SAW devices. To clarify how nonlinearity depends on the stack of layered systems, test devices with a nearly constant admittance curve for respectively different layer stacks were designed. Using the Design of Experiment methodology, a response surface depending on three layer thicknesses was derived.

Involved external institutions

Technische Universität München (TUM) DE Germany (DE) RF360 Europe GmbH DE Germany (DE)

How to cite

APA:

Forster, T., Mayer, M., Chauhan, V., Schmidt, P., Ebner, T., Wagner, K., & Hagelauer, A. (2022). Layer Stack Dependencies of Self-Generated Nonlinear Signals in Layered SAW Resonators. In IEEE International Ultrasonics Symposium, IUS. Venice, ITA: IEEE Computer Society.

MLA:

Forster, Thomas, et al. "Layer Stack Dependencies of Self-Generated Nonlinear Signals in Layered SAW Resonators." Proceedings of the 2022 IEEE International Ultrasonics Symposium, IUS 2022, Venice, ITA IEEE Computer Society, 2022.

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