On-chip nano-localization via transverse kerker scattering
Bag A, Neugebauer M, Mick U, Christiansen S, Schulz SA, Banzer P (2020)
Publication Type: Conference contribution
Publication year: 2020
Publisher: Optica Publishing Group (formerly OSA)
Conference Proceedings Title: Optics InfoBase Conference Papers
Event location: Washington, DC, USA
ISBN: 9781943580804
Abstract
Here we present a transverse Kerker scattering based sub-wavelength localization technique transferred to a chip-scale all-optical displacement sensing device, which could act as a metrological instrument in modern lithography and microscopy, or monitor system drifts.
Involved external institutions
Max-Planck-Institut für die Physik des Lichts (MPL) / Max Planck Institute for the Science of Light
Germany (DE)
University of St Andrews
United Kingdom (GB)
Germany (DE)
University of St Andrews
United Kingdom (GB)
How to cite
APA:
Bag, A., Neugebauer, M., Mick, U., Christiansen, S., Schulz, S.A., & Banzer, P. (2020). On-chip nano-localization via transverse kerker scattering. In Optics InfoBase Conference Papers. Washington, DC, USA: Optica Publishing Group (formerly OSA).
MLA:
Bag, Ankan, et al. "On-chip nano-localization via transverse kerker scattering." Proceedings of the 2020 Frontiers in Optics Conference, FiO 2020, Washington, DC, USA Optica Publishing Group (formerly OSA), 2020.
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