Wear-Induced Attenuation on Transmission Lines and Their Causes

Lenz P, Baron P, Wittmann A, Fischer G (2022)


Publication Language: English

Publication Type: Journal article, Original article

Publication year: 2022

Journal

DOI: 10.1007/s42341-022-00423-7

Open Access Link: https://link.springer.com/article/10.1007/s42341-022-00423-7

Abstract

In this paper, the radio frequency (RF) behavior of mechanically stressed coaxial and for the first time also twisted-pair transmission lines is investigated over their service life. The main goal is to enable predictive maintenance for cables in moving applications and avoid preventive replacement. This also reduces the use of high-cost resources. For this purpose, stranded and solid-core variants of coaxial and twisted-pair type cables are mechanically loaded on the two-pulley apparatus according to EN 50396. Their RF transmission (S21) behavior is measured using a vector network analyzer and presented over bending cycles. For the first time, the phase response of mechanically loaded transmission lines is evaluated with respect to their service life. Two significant causes for the increasing attenuation and altered phase response are identified: Breakage in foil screen and increasing surface roughness on the copper conductors. The identified causes are supported with literature evidence. Through measurements and theoretical calculations, it is proven that the phase is much more suitable for an assessment of the remaining service life than the amplitude. The findings can be used to implement a cable monitoring system in industrial environments which monitors the lines in-situ and reminds the user to replace them, whenever a certain wear-level is reached.

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How to cite

APA:

Lenz, P., Baron, P., Wittmann, A., & Fischer, G. (2022). Wear-Induced Attenuation on Transmission Lines and Their Causes. Transactions on Electrical and Electronic Materials. https://doi.org/10.1007/s42341-022-00423-7

MLA:

Lenz, Philipp, et al. "Wear-Induced Attenuation on Transmission Lines and Their Causes." Transactions on Electrical and Electronic Materials (2022).

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