Thickness dependence of the anomalous Nernst effect and the Mott relation of Weyl semimetal Co2MnGa thin films
Park GH, Reichlova H, Schlitz R, Lammel M, Markou A, Swekis P, Ritzinger P, Kriegner D, Noky J, Gayles J, Sun Y, Felser C, Nielsch K, Goennenwein STB, Thomas A (2020)
Publication Type: Journal article
Publication year: 2020
Journal
Book Volume: 101
Article Number: 060406
Journal Issue: 6
DOI: 10.1103/PhysRevB.101.060406
Abstract
We report a robust anomalous Nernst effect in Co2MnGa thin films in the thickness regime between 20 and 50 nm. The anomalous Nernst coefficient varied in the range of -2.0 to -3.0 μV/K at 300 K. We demonstrate that the anomalous Hall and Nernst coefficients exhibit similar behavior and fulfill the Mott relation. We simultaneously measure all four transport coefficients of the longitudinal resistivity, transversal resistivity, Seebeck coefficient, and anomalous Nernst coefficient. We connect the values of the measured and calculated Nernst conductivity by using the remaining three magnetothermal transport coefficients, where the Mott relation is still valid. The intrinsic Berry curvature dominates the transport due to the relation between the longitudinal and transversal transport. Therefore, we conclude that the Mott relationship is applicable to describe the magnetothermoelectric transport in Weyl semimetal Co2MnGa as a function of film thickness.
Involved external institutions
Max-Planck-Institut für Chemische Physik fester Stoffe (MPI CPfS) / Max Planck Institute for Chemical Physics of Solids
Germany (DE)
Technische Universität Dresden
Germany (DE)
Leibniz-Institut für Festkörper- und Werkstoffforschung Dresden e.V. (IFW) / Leibniz Institute for Solid State and Materials Research Dresden
Germany (DE)
Germany (DE)
Technische Universität Dresden
Germany (DE)
Leibniz-Institut für Festkörper- und Werkstoffforschung Dresden e.V. (IFW) / Leibniz Institute for Solid State and Materials Research Dresden
Germany (DE)
How to cite
APA:
Park, G.-H., Reichlova, H., Schlitz, R., Lammel, M., Markou, A., Swekis, P.,... Thomas, A. (2020). Thickness dependence of the anomalous Nernst effect and the Mott relation of Weyl semimetal Co2MnGa thin films. Physical Review B, 101(6). https://doi.org/10.1103/PhysRevB.101.060406
MLA:
Park, Gyu-Hyeon, et al. "Thickness dependence of the anomalous Nernst effect and the Mott relation of Weyl semimetal Co2MnGa thin films." Physical Review B 101.6 (2020).
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